X-ray Techniques | X-ray Analysis | Covalent Metrology Analytical Labs
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X-ray Analysis

X-ray Analysis

X-ray analysis can reveal a sample’s chemical composition and assess numerous structural properties of crystalline, semicrystalline, or amorphous materials. The diversity of x-ray techniques makes them widely suited for analysis in the research and development of semiconductors, photovoltaics, pharmaceuticals, and other advanced material technologies.

Covalent supplies a range of services to support your work with x-ray characterization: with x-ray diffraction (XRD), analysts can measure offcut and residual stress, generate reciprocal space maps, characterize crystal structure, and more; X-ray reflectometry (XRR) can be used to analyze thickness and interfacial roughness of multilayer thin films; X-ray spectroscopy methods – such as x-ray fluorescence (XRF) spectroscopy – provide relative elemental composition; and x-rays can be used in 2D and 3D imaging via digital x-ray radiography and micro-computed tomography (micro-CT).

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