X-ray Analysis
X-ray analysis can reveal a sample’s chemical composition and assess numerous structural properties of crystalline, semicrystalline, or amorphous materials. The diversity of x-ray techniques makes them widely suited for analysis in the research and development of semiconductors, photovoltaics, pharmaceuticals, and other advanced material technologies.
Covalent supplies a range of services to support your work with x-ray characterization: with x-ray diffraction (XRD), analysts can measure offcut and residual stress, generate reciprocal space maps, characterize crystal structure, and more; X-ray reflectometry (XRR) can be used to analyze thickness and interfacial roughness of multilayer thin films; X-ray spectroscopy methods – such as x-ray fluorescence (XRF) spectroscopy – provide relative elemental composition; and x-rays can be used in 2D and 3D imaging via digital x-ray radiography and micro-computed tomography (micro-CT).
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Techniques Showcase
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
Nanoindentation (Nano-Indent)
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
Scanning Acoustic Microscopy (SAM)
Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the...
Scanning Transmission Electron Microscopy (STEM)
STEM is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. In Covalent's...
Transmission Electron Microscopy (TEM)
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial...
Glow Discharge Optical Emission Spectroscopy (GDOES)
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...
Capillary Flow Porometry (Porometry)
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution.
Porosimetry
Gas Adsorption Analysis is used for measuring specific surface area, pore sizes / size distribution, and overall porosity...
Tap Density Analysis
Tap Density Analysis provides fast, effective measurements of the bulk density of powders and establishes a quantitative metric...
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
X-ray Computed Tomography (Micro-CT)
X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D...
Nanoindentation (Nano-Indent)
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
