Covalent Metrology is an advanced materials science and analytical services platform headquartered in the heart of Silicon Valley.
We have a proven track record of helping scientists and engineers from many of the most influential companies in the world better understand the optical, chemical, physical, and electrical properties of their new products and technologies. Covalent Metrology succeeds through a unique combination of cutting-edge analytical instruments and a world-class team of scientists: enabling us to provide our clients actionable, accurate and affordable data and insights to accelerate the development of product and technology innovations.
Together with our strategic partners and clients, we are pushing the boundaries of materials science to develop new products and services that will revolutionize the industry as we know it. It is Covalent Metrology’s mission to ensure that every company, no matter the size, has access to the data and expertise they need to move science forward – faster, affordably, and with confidence.
Photo-induced Force Microscopy (PiFM) is a new-age analytical technique that revolutionizes Atomic Force Microscopy (AFM) with chemical mapping capabilities. This groundbreaking technology is orders of magnitude more sensitive and precise than FTIR yet maintains comparable spatial resolutions to other advanced AFM modes. These combined features make PiFM a powerful complement to other surface analytical techniques, […]
In this webinar event, guest speaker Dr. Thomas Luxbacher, Principal Scientist in Surface Charge Analysis at Anton Paar, will explore the complementarity of solid- and solution-state zeta potential measurements. His talk will take you through classical and contemporary applications of these techniques, showcasing their reciprocal insights. Through this series of case studies, you’ll learn how […]
Nanoscale Secondary Ion Mass Spectroscopy (NanoSIMS) is a unique analytical method which combines the extremely high sensitivity and mass resolution of SIMS with an improved optical design that facilitates high lateral resolution (as low as 50 nm): up to 50 times greater than conventional SIMS. This facilitates targeting of microscopic grains and structures in materials […]
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